JPK Nanowizard 4 Atomic Force Microscope
JPK Nanowizard 4 atomic force microscope mounted on a Nikon A1 confocal microscope. The hybrid scope allows the simultaneous and complementary investigation of samples in optical and nanomechanical/topographical ways. The Nanowizard combines fast tip scanning with high resolution scan seizes of up to 100 µm2. The unique architecture of the instrument, together with an acoustic enclosure and a stage top Petri dish heater, provides the mechanical and thermal stability to afford time laps imaging of living cells and observation of tissue dynamics in real time, while simultaneously covering the same optical and nanomechanical field of view. A comprehensive software suite facilitates many modes of data acquisition and analysis, including imaging force spectroscopy, direct overlay and nanolithography. Further, complementary and additional software for the analysis of AFM data, Gwyddion, is available on a separate workstation.
The Nikon A1 is equipped with four channels for confocal laser scanning and a high resolution water cooled sCMOS camera for fast and sensitive epi widefield fluorescence and brightfield/phase/DIC imaging.